Titre : |
Metrology for characterizing scratch resistance of polymer coatings |
Type de document : |
texte imprimé |
Auteurs : |
Li-Piin Sung, Auteur ; Shuo-Hung Chang, Auteur ; Tsun Yen Wu, Auteur ; Mark R. van Landingham, Auteur ; Peter L. Drzal, Auteur |
Année de publication : |
2005 |
Article en page(s) : |
p. 583-589 |
Note générale : |
Bibliogr. |
Langues : |
Américain (ame) |
Tags : |
Microscopie confocale laser balayage Oléfine polymère Propriété esthétique Etude expérimentale Mesure optique Durabilité Dureté Méthacrylate de méthyle Déformation plastique surface Morphologie mécanique Brillant Matériau revêtement Propène Résistance rayure |
Index. décimale : |
667.9 Revêtements et enduits |
Résumé : |
Current methods for scratch resistance assessment are often based on "relative but not quantitative" types of measurements, such as visual inspection, gloss changes, and changes in gray scale level or lightness. Most results are used for qualitative assessment purposes, which result in the lack of a repeatable and reliable standardized test method for the polymer materials community. To implement a scientifically based standardized test method for quantifying scratch resistance, it is vital to understand the relationships between material mechanical properties, morphology, and appearance (optical properties) of surface and subsurface deformation. In this article, preliminary results from a scratch testing protocol to identify the "onset" of plastic deformation in poly(methyl methacrylate) and poly(propylene) commercial samples are presented. Recent advances in optical scattering measurements to identify the onset of plastic deformation by analyzing specular and off-specular intensities are also presented. |
DOI : |
10.1007/BF02774587 |
En ligne : |
https://link.springer.com/content/pdf/10.1007%2FBF02774587.pdf |
Format de la ressource électronique : |
Pdf |
Permalink : |
https://e-campus.itech.fr/pmb/opac_css/index.php?lvl=notice_display&id=3783 |
in JOURNAL OF COATINGS TECHNOLOGY AND RESEARCH > Vol. 2, N° 8 (10/2005) . - p. 583-589