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Imaging ellipsometry study of multi-layer microflakes / H. Rafla-Yuan in JOURNAL OF COATINGS TECHNOLOGY (JCT), Vol. 72, N° 907 (08/2000)

Titre :	Imaging ellipsometry study of multi-layer microflakes
Type de document :	texte imprimé
Auteurs :	H. Rafla-Yuan, Auteur ; D. Hoenig, Auteur
Année de publication :	2000
Article en page(s) :	p. 103-106
Note générale :	Bibliogr.
Langues :	Américain (ame)
Tags :	Matériau revêtement Pigment métallique Aluminium revêtu Couche mince Silice Formation image Ellipsométrie Etude expérimentale
Index. décimale :	667.9 Revêtements et enduits
Résumé :	Ellipsometers are commonly used for characterizing thin film coatings. Although they continue to be useful for many applications, the size of the samples has to be restricted to be no less than a few millimeters. In this paper we report on using an imaging ellipsometer to study the characteristics of an SiO2 coating on aluminum microflakes. This novel approach overcomes the lateral resolution limit of conventional ellipsometers, providing access to samples with very small dimensions. A comparison was also made between the coating thickness obtained from imaging ellipsometry and electron microscopy.
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