[article]
| Titre : |
Structural analysis of coating film with ultra-small-angle X-ray scattering |
| Type de document : |
texte imprimé |
| Auteurs : |
Iwao Soga, Auteur ; Hideki Matsuoka, Auteur |
| Année de publication : |
2001 |
| Article en page(s) : |
p. 105-110 |
| Note générale : |
Bibliogr. |
| Langues : |
Américain (ame) |
| Tags : |
Matériau revêtement Peinture magnétique Analyse structurale Diffusion RX centrale |
| Index. décimale : |
667.9 Revêtements et enduits |
| Résumé : |
The structure of magnetic coating films was analyzed by the ultra-small-angle X-ray scattering (USAXS) technique. Small-angle X-ray scattering (SAXS) has been used to investigate the size, shape, and correlation of the nm sized structure. USAXS, with a measurable range extending to the µm order, can be used to analyze the submicron sized structure of paints and coating films. Preliminary USAXS experiments for a magnetic paint and magnetic coating films revealed that USAXS is useful to evaluate the structure of the particles in the paint and the films. Combined with other experimental methods, USAXS will provide a new kind of information about the structural analysis. |
| Permalink : |
https://e-campus.itech.fr/pmb/opac_css/index.php?lvl=notice_display&id=5744 |
in JOURNAL OF COATINGS TECHNOLOGY (JCT) > Vol. 73, N° 919 (08/2001) . - p. 105-110
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Structural analysis of coating film with ultra-small-angle X-ray scattering in JOURNAL OF COATINGS TECHNOLOGY (JCT), Vol. 73, N° 919 (08/2001)
