Titre : |
XPS - a tool for the chemical characterisation of coatings and interfaces |
Type de document : |
texte imprimé |
Auteurs : |
R. G. White, Auteur ; R. Wolstenholme, Auteur |
Année de publication : |
2010 |
Article en page(s) : |
p. 204-207 |
Langues : |
Anglais (eng) |
Catégories : |
Caractérisation Chimie des surfaces Couches minces Revêtements -- Analyse Spectroscopie de photoélectrons
|
Index. décimale : |
667.9 Revêtements et enduits |
Résumé : |
X-ray photoelectron spectroscopy (XPS) is widely accepted for the quantitative, chemical characterisation of surfaces, thin films and interfaces and is commonly used for both failure analysis and development of new coating systems. The performance of coatings is, in part, determined by the chemistry of the surfaces and interfaces involved. XPS allows the analyst to obtain chemical state information only from the top surface or interface region of the specimen.
This paper will include a description of the technique and the required instrumentation. It will go on to provide several relevant examples of its application to the coatings industry. Examples will be given in the area of coated glass and painted surfaces showing, in detail, the information available from this powerful technique. |
Note de contenu : |
- WHY IS SURFACE ANALYSIS NECESSARY ?
- WHAT IS XPE ? : Why is XPS surface-specific ? - Components of an XPS spectrometer
- EXAMPLES OF THE USE OF XPS IN COATINGS AND INTERFACES : Low-emissivity glass - Painted surfaces |
En ligne : |
https://drive.google.com/file/d/1xVDTrwrxh4fPC3SY8vmU-lr1fkQy-lwR/view?usp=drive [...] |
Format de la ressource électronique : |
Pdf |
Permalink : |
https://e-campus.itech.fr/pmb/opac_css/index.php?lvl=notice_display&id=16316 |
in SURFACE COATINGS INTERNATIONAL > Vol. 93, 4 (08/2010) . - p. 204-207