| Titre : |
A new sample preparation technique for the examination and analysis of paint film defects |
| Type de document : |
texte imprimé |
| Auteurs : |
Thomas J. Veneri, Auteur ; Jack A. Kramer, Auteur |
| Année de publication : |
1994 |
| Article en page(s) : |
p. 23-29 |
| Note générale : |
Bibliogr. |
| Langues : |
Américain (ame) |
| Catégories : |
Couches minces -- Défauts
Echantillonnage
Revêtements -- Analyse:Peinture -- Analyse
Revêtements -- Défauts:Peinture -- Défauts
|
| Index. décimale : |
667.9 Revêtements et enduits |
| Résumé : |
A paint film cross-sectioning technique has been developed which allows simultaneous characterization of a paint defect and the underlying substrate and pretreatment. The advantages of the technique include speed, accuracy of cross-sectioning the defect, simplicity, lack of polishing artifacts, and a pseudo-three-dimensional perspective which uniquely reveals the relationship between the defect, paint film and substrate. Disadvantages include possible damage to the sample or removal of contaminants by the solvents used. The prepared sample may be examined using an optical or scanning electron microscope (SEM), and analyzed by x-ray fluorescence (XRF) or other methods. The technique has proven especially useful for pinpointing the cause of defects resulting from interaction of the substrate or pretreatment with the paint film. This paper describes the practice of the technique and its application to solving production problems related to paint defects |
| Note de contenu : |
- Galvanized gassing
- Paint inclusions
- Rinse deposits
- Nubbing
- Weld balls
- Galvanizing defects
- Pinholing
- Cratering |
| Permalink : |
https://e-campus.itech.fr/pmb/opac_css/index.php?lvl=notice_display&id=18585 |
in JOURNAL OF COATINGS TECHNOLOGY (JCT) > Vol. 66, N° 829 (02/1994) . - p. 23-29
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A new sample preparation technique for the examination and analysis of paint film defects in JOURNAL OF COATINGS TECHNOLOGY (JCT), Vol. 66, N° 829 (02/1994)
