Fabrication and characterization of Cd-enriched CdTe thin films by close spaced sublimation / M. Arif Khan in JOURNAL OF COATINGS TECHNOLOGY AND RESEARCH, Vol. 6, N° 2 (06/2009)  

[article]  inJOURNAL OF COATINGS TECHNOLOGY AND RESEARCH > Vol. 6, N° 2 (06/2009) . - p. 251-256 Titre : Fabrication and characterization of Cd-enriched CdTe thin films by close spaced sublimation Type de document : texte imprimé Auteurs : M. Arif Khan, Auteur ; Nazar Shah, Auteur ; A. Ali, Auteur ; M. Basharat, Auteur ; M. A. Hannan, Auteur ; A. Maqsood, Auteur Année de publication : 2009 Article en page(s) : p. 251-256 Note générale : Bibliogr. Langues : Américain (ame) Catégories : Caractérisation Couches minces Résistance des matériaux Revêtements:Peinture Tellurure de cadmium Index. décimale : 667.9 Revêtements et enduits Résumé : Cd-enriched cadmium telluride (CdTe) polycrystalline films were grown on coming glass substrates by close spaced sublimation (CSS) technique. To our knowledge, Cd-enriched CdTe thin films by CSS have not been reported earlier. The structural investigations performed by means of X-ray diffraction (XRD) technique, scanning electron microscope (SEM), and energy dispersive X-ray spectroscopy (EDX) showed that the deposited films exhibit a polycrystalline structure with 〈111〉 as preferred orientation. The structural, optical, and electrical properties of these films were analyzed as a function of the Cd concentration. For the films having an excess of Cd, the electrical resistivity dropped several orders of magnitude. The deposited films also showed that the value of resistivity decreased with increasing temperature manifesting the semiconducting behavior of the films. The results showed that using this deposition technique, n-type Cd-enriched CdTe polycrystalline film could be produced. DOI : 10.1007/s11998-008-9111-y En ligne : https://link.springer.com/content/pdf/10.1007%2Fs11998-008-9111-y.pdf Format de la ressource électronique : Pdf Permalink : https://e-campus.itech.fr/pmb/opac_css/index.php?lvl=notice_display&id=5626 [article]

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Physical properties of copper-treated cadmium telluride thin films by vacuum evaporation technique / Nazar Shah in JOURNAL OF COATINGS TECHNOLOGY AND RESEARCH, Vol. 7, N° 4 (07/2010)  

[article]  inJOURNAL OF COATINGS TECHNOLOGY AND RESEARCH > Vol. 7, N° 4 (07/2010) . - p. 521-524 Titre : Physical properties of copper-treated cadmium telluride thin films by vacuum evaporation technique Type de document : texte imprimé Auteurs : Nazar Shah, Auteur Année de publication : 2010 Article en page(s) : p. 521-524 Note générale : Bibliogr. Langues : Américain (ame) Catégories : Couches minces Revêtement de surface Tellurure de cadmium Index. décimale : 667.9 Revêtements et enduits Résumé : Cadmium telluride thin films were prepared on microscopic glass substrates by vacuum evaporation technique. The morphology of the thin films as a function of substrate temperature and postdeposition heat treatment was investigated by atomic force microscopy. The grain size increases with the increase of substrate temperature and postdeposition annealing. Calculated amount of copper was evaporated to deposit on the top of the already deposited CdTe thin films. The whole assembly was then annealed at 450°C for about 4–6 min. These samples were characterized structurally, optically, and electrically by using XRD, spectrophotometer, and Hall Effect measurements, respectively. Doping with Cu has significantly changed the electrical properties of the CdTe films. The measurements have shown band gap of 1.475 eV and resistivity ranging from 0.132 to 0.002 Ω cm, depending on the copper concentration. Increase in the weight percentage of copper showed decreasing trends in resistivity up to 3 wt%. Mobility showed the opposite behavior than those of the resistivity. The carrier concentration showed a systematic increase. DOI : 10.1007/s11998-009-9211-3 En ligne : https://link.springer.com/content/pdf/10.1007%2Fs11998-009-9211-3.pdf Format de la ressource électronique : Pdf Permalink : https://e-campus.itech.fr/pmb/opac_css/index.php?lvl=notice_display&id=9776 [article]

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Processing of CdTe thin films by intense pulsed light in the presence of CdCl2 / R. Dharmadasa in JOURNAL OF COATINGS TECHNOLOGY AND RESEARCH, Vol. 12, N° 5 (09/2015)  

[article]  inJOURNAL OF COATINGS TECHNOLOGY AND RESEARCH > Vol. 12, N° 5 (09/2015) . - p. 835-842 Titre : Processing of CdTe thin films by intense pulsed light in the presence of CdCl2 Type de document : texte imprimé Auteurs : R. Dharmadasa, Auteur ; Brandon W. Lavery, Auteur ; I. M. Dharmadasa, Auteur ; Thad Druffel, Auteur Année de publication : 2015 Article en page(s) : p. 835-842 Note générale : Bibliogr. Langues : Américain (ame) Catégories : Couches minces Dépôt électrolytique Dépôt par lumière pulsée Tellurure de cadmium Traitement thermique Index. décimale : 667.9 Revêtements et enduits Résumé : Intense pulsed light (IPL) treatment was used for rapid thermal processing of electroplated CdTe layers, with and without CdCl2. Electroplated CdTe layers consist of small grains showing highly preferential orientation along the (111) planes. IPL processing improves the crystallinity keeping the (111) preferred orientation until an energy input threshold is reached. IPL treatment beyond this point shows a sudden structural transition within the layer with a decrease in each of the orientations. The addition of a CdCl2 treatment prior to the IPL initiates a transition from the preferred (111) orientation to randomly oriented grains throughout the film. X-ray diffraction, scanning electron microscopy, and optical microscopy were used to study the structural and morphological changes of these films. Note de contenu : - IPL and the number of pulses (without CdCl2) - IPL treatment with CdCl2 DOI : 10.1007/s11998-015-9688-x En ligne : https://link.springer.com/content/pdf/10.1007%2Fs11998-015-9688-x.pdf Format de la ressource électronique : Pdf Permalink : https://e-campus.itech.fr/pmb/opac_css/index.php?lvl=notice_display&id=24682 [article]

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