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Continuous control of sealing seams / Christian Florin in ADHESION - ADHESIVES + SEALANTS, Vol. 14, N° 1/2017 (2017)
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Titre : Continuous control of sealing seams Type de document : texte imprimé Auteurs : Christian Florin, Auteur Année de publication : 2017 Article en page(s) : p. 28-31 Langues : Multilingue (mul) Catégories : Adhésion
Contrôle non destructif
Imagerie (technique)
Joints d'étanchéité
Mesure
TomographieIndex. décimale : 668.3 Adhésifs et produits semblables Résumé : The main field of application of optical coherence tomography has hitherto been in the medicine. Thanks to their strengths, this non-destructive measurement technology has also been predicted for some time as a major target for the industry. For example, the OCT method could help to ensure the quality of sealed seams in the running production process to 100%. Note de contenu : - Initial position
- The task
- The measuring process
- High resolution
- Adhesion
- FIGURES : This OCT image shows an inclusion in the sealed seam - 2. The system for sealing seam inspection for laboratory operation and a test cell as an off-line station have proved their value in day-to-day use in industry - 3. Schematic representation of the measuring principle - 4. The particle appears as an additional layer in an otherwise homogeneous seal seam - 5. The arrow on the left picture shows the edge of the welded particle, the arrow on the right picture shows a topography change due to a welded hair - 6. The cover film, consisting of two layers, can be seen on this OCT image. This followed by the adhesive layer and the carrier of the adhesive layer, which partially do not show any connection to the carrier. It is also possible to deduce the depth of the light reflections from the OCT signals - 7. This sketch of a seal seam and associated OCT image show various sealing errors and inclusions on flat and profiled outsides as well as air pockets or leakage points - 8. Sketched sealing zone using the example of a four-layer film
- TABLE : All types of faults, which are to be found destructively by the inspected devicePermalink : https://e-campus.itech.fr/pmb/opac_css/index.php?lvl=notice_display&id=28063
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