| Titre : |
Measurements without hardware exchange : Characterize plastic surfaces more easily with Atomic Force Microscopy |
| Type de document : |
texte imprimé |
| Auteurs : |
Jelena Fischer, Auteur ; Dirk Meister, Auteur ; Michael Schäffler, Auteur |
| Année de publication : |
2021 |
| Article en page(s) : |
p. 46-49 |
| Langues : |
Anglais (eng) |
| Catégories : |
Capteurs (technologie)
Caractérisation
Films plastiques
Mesure
Microscopie à force atomique
Polyméthacrylate de méthyleLe poly(méthacrylate de méthyle) (souvent abrégé en PMMA, de l'anglais Poly(methyl methacrylate)) est un polymère thermoplastique transparent obtenu par polyaddition dont le monomère est le méthacrylate de méthyle (MMA). Ce polymère est plus connu sous son premier nom commercial de Plexiglas (nom déposé), même si le leader global du PMMA est Altuglas International9 du groupe Arkema, sous le nom commercial Altuglas. Il est également vendu sous les noms commerciaux Lucite, Crystalite, Perspex ou Nudec.
|
| Index. décimale : |
668.4 Plastiques, vinyles |
| Résumé : |
Atomic force microscopy can be used to determine various properties of polymer surfaces. However, until now it was still necessary to change the hardware on the probe for different measurement methods. A special sensor technology eliminates the need to replace the head. The example of an investigation of a polymer thin film shows how this enables the precise characterization of polymers. |
| Note de contenu : |
- CRAI measurement reveals height difference
- Two pass technique for the determinationof contact potential difference
- Differences in contact potential show differences in material composition
- Combination of measurement methods enables accurate characterization
- Figure : With the Tosca series, all AFM measurements can be carried out with only one actuator body and thus without hardware exchange
- Fig. 1 : Insertion of the actuator body with cantilever into the AFM: the z-sensor is integrated in the compact and lightweight actuator body without any cables
- Fig. 2 : Schematic representation of the CRAI measuring principle: differences in the stiffness of the specimen and a height image are generated
- Fig. 3 : The height image from the CRAI investigation reveals height differences in the polymer thin film. The determined islands are higher than the matrix
- Fig. 4 : The CRAI measurement shows a contrast in the amplitude (left) and the phase (right). This indicates that the higher structures consist of not only of one but of both polymers
- Fig. 5 : Schematic representation of the force-distance curve (FDC): the force between the probe and the sample is measured as a function of the distance the probe moves
- Fig. 6 : Measurement of the force-distance curve (FDC)
- Fig. 7 : In the KPFM, the height information is determined by tapping mode scan in the first pass. The second pass (lift) with the cantilever lifted takes place at a constant height above the sample
- Fig. 8 : Superposition of 3D CRAI amplitude and contact potential difference (CPD) shows the higher potential difference for structures which are mainly composed of one polymer |
| En ligne : |
https://drive.google.com/file/d/1meLq45-FbzyNKZ1PwigA7mBdcYnUwjCr/view?usp=drive [...] |
| Format de la ressource électronique : |
Pdf |
| Permalink : |
https://e-campus.itech.fr/pmb/opac_css/index.php?lvl=notice_display&id=36170 |
in KUNSTSTOFFE INTERNATIONAL > Vol. 111, N° 5 (2021) . - p. 46-49
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Measurements without hardware exchange in KUNSTSTOFFE INTERNATIONAL, Vol. 111, N° 5 (2021)
