Novel-stratified low reflectivity anti-reflective coatings derived from self-assembly of high refractive index nanoparticles / Konstantinos Kourtakis in JOURNAL OF COATINGS TECHNOLOGY AND RESEARCH, Vol. 13, N° 6 (11/2016)  

[article]  inJOURNAL OF COATINGS TECHNOLOGY AND RESEARCH > Vol. 13, N° 6 (11/2016) . - p. 953-961 Titre : Novel-stratified low reflectivity anti-reflective coatings derived from self-assembly of high refractive index nanoparticles Type de document : texte imprimé Auteurs : Konstantinos Kourtakis, Auteur ; Mark Lewittes, Auteur ; Bao-Ling Yu, Auteur ; Shekhar Subramoney, Auteur Année de publication : 2016 Article en page(s) : p. 953-961 Note générale : Bibliogr. Langues : Américain (ame) Catégories : Diélectriques Dioxyde de silicium Dioxyde de titane Fluoropolymères Nanoparticules Réflectance Revêtement antireflet Revêtements multicouches Systèmes auto-assemblés Index. décimale : 667.9 Revêtements et enduits Résumé : We describe new anti-reflective multilayer optical coatings formed from a single liquid coating solution in a single coating step. The nanoparticles in these coatings self-organize as the liquid coating dries on the substrate. The self-assembly of the nanoparticles results in the formation of a two-layer dielectric stack composed of alternating high and low refractive index layers. For the first time, using this process, an ultra-low reflectivity film can be inexpensively and simply formed using high refractive index titanium oxide nanoparticles and a low refractive index fluoropolymer. These films can be made scratch or abrasion resistant by the inclusion of silane coupling agents and low refractive index nanoparticles. Note de contenu : -EXPERIMENTAL METHODS : Coating formulations - Coating method - Specular reflectance measurements - Mechanical robustness: abrasion testing to determine abraded area percentage - Electron microscopy - RESULTS AND DISCUSSION : Quarter quarter design - W Design - V Design - Two-layer dielectric stack : use of the model design principles - Two-layer dielectric stack by self-assembly of TiO2 and SiO2 nanoparticle mixtures DOI : 10.1007/s11998-016-9822-4 En ligne : https://link.springer.com/content/pdf/10.1007%2Fs11998-016-9822-4.pdf Format de la ressource électronique : Pdf Permalink : https://e-campus.itech.fr/pmb/opac_css/index.php?lvl=notice_display&id=27242 [article]

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