Analysis of transparent conductive silver nanowire films from dip coating flow / Kwangguk Ahn in JOURNAL OF COATINGS TECHNOLOGY AND RESEARCH, Vol. 12, N° 5 (09/2015)  

[article]  inJOURNAL OF COATINGS TECHNOLOGY AND RESEARCH > Vol. 12, N° 5 (09/2015) . - p. 855-862 Titre : Analysis of transparent conductive silver nanowire films from dip coating flow Type de document : texte imprimé Auteurs : Kwangguk Ahn, Auteur ; Dongjae Kim, Auteur ; Onyu Kim, Auteur ; Jaewook Nam, Auteur Année de publication : 2015 Article en page(s) : p. 855-862 Note générale : Bibliogr. Langues : Américain (ame) Catégories : Analyse d'image L'analyse d'image est la reconnaissance des éléments contenus dans l'image. Il ne faut pas confondre analyse (décomposition en éléments) et traitement (action sur les composantes) de l'image. Argent Conduction électrique Dip-coating Matériaux -- Propriétés optoélectroniques Nanoparticules Transparence (optique) Index. décimale : 667.9 Revêtements et enduits Résumé : Silver nanowires are a promising nanomaterial for the fabrication of transparent flexible conductive films. Due to their fascinating properties, numerous studies have been done to determine the relationship among nanowire properties, micro-network structure, and opto-electronic properties, such as transparency and conductivity.1,2 However, most previous studies have used methods that are not suitable for mass production, such as vacuum filtration. To produce the film economically, it is advisable to use a solution process, e.g., a liquid coating method. In this study, we use a simple dip coating method to produce the film using a coating solution, which disperses nanowires in isopropyl alcohol. The amount of nanowires on the film is carefully controlled by the wet film thickness predicted from computational analysis. The important parameters of nanowire networks, such as the diameter, the aspect ratio, and the areal coverage of nanowires are measured directly from image analysis of the electron microscopy images. Finally, the relationship among those parameters and opto-electronic properties is examined in detail. Note de contenu : - EXPERIMENTAL AND NUMERICAL METHODS : Experimental setup and procedure - Prediction of coating thickness and number of nanowires - Image analysis to extract individual nanowires - RESULTS AND DISCUSSION : Thickness prediction for confined dip coating flow - Length and diameter analyses - Estimated and measured area fractions - transparency and sheet resistance DOI : 10.1007/s11998-015-9690-3 En ligne : https://link.springer.com/content/pdf/10.1007%2Fs11998-015-9690-3.pdf Format de la ressource électronique : Pdf Permalink : https://e-campus.itech.fr/pmb/opac_css/index.php?lvl=notice_display&id=24685 [article]

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