| Titre : |
A study of water at the organic coating/substrate interface |
| Type de document : |
texte imprimé |
| Auteurs : |
Tinh Nguyen, Auteur ; Dale Bentz, Auteur ; Eric Byrd, Auteur |
| Année de publication : |
1994 |
| Article en page(s) : |
p. 39-49 |
| Note générale : |
Bibliogr. |
| Langues : |
Américain (ame) |
| Catégories : |
Chimie des surfaces
Couches minces
Décollement cathodique (revêtement)
Humidité -- Absorption
Revêtements -- Détérioration
Revêtements:Peinture
|
| Index. décimale : |
667.9 Revêtements et enduits |
| Résumé : |
Quantitative information on the water layer at the coating/substrate interface is crucial for understanding and preventing the failure of organic coating systems. A method, based on a two-layered model derived rigorously from internal reflection theory, was developed for determining the amount and thickness of water at the organic coating/substrate interface. The method gives new insight into the processes by which water degrades the coating/substrate bonds. The method requires application of a transparent or opaque organic coating of sufficient thickness on an internal reflection element (IRE), which is used as the substrate. A water chamber is attached to the coated specimen (...) |
| Note de contenu : |
- THEORETICAL FORMULATION
- EXPERIMENTAL SECTION: FTIR-MIR in situ measurements on coated specimens exposed to water - FTIR-MIR analysis of water on Ge and SiO2-Si substrates - Water uptake in free films of coating
- RESULTS AND DISCUSSION: FTIR-MIR in situ measurements on coated specimens exposed to water
- QUANTITATIVE ANALYSES: FTIR-MIR probing depth in organic coating/substrate sample - Water uptake in the coatings - Thickness and amount of water at the coating/substrate interface - Discussion |
| Permalink : |
https://e-campus.itech.fr/pmb/opac_css/index.php?lvl=notice_display&id=18654 |
in JOURNAL OF COATINGS TECHNOLOGY (JCT) > Vol. 66, N° 834 (07/1994) . - p. 39-49
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A study of water at the organic coating/substrate interface in JOURNAL OF COATINGS TECHNOLOGY (JCT), Vol. 66, N° 834 (07/1994)
