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X-ray photoelectron spectroscopy as an analysis tool for coatings in COATINGS TECH, Vol. 8, N° 2 (02/2011)

Titre :	X-ray photoelectron spectroscopy as an analysis tool for coatings
Type de document :	texte imprimé
Année de publication :	2011
Article en page(s) :	p. 42-51
Langues :	Américain (ame)
Catégories :	Revêtements -- Analyse Spectroscopie de photoélectrons
Index. décimale :	667.9 Revêtements et enduits
Résumé :	X-ray photoelectron spectroscopy as an analysis tool for coatings --- This article is the second in a series focusing on surface analysis techniques for studying the surface composition of solid materials in automotive paint operations. The first, published in the january 2011, provided an overview of three techniques that will be covered in the series. Upcoming articles will detail Auger electron spectroscopy (AES) and secondary ion mass spectrometry (SIMS). Together, these complementary methods can be used to resolve the majority of the technical questions that concern the surface chemistry of solid materials.
En ligne :	https://drive.google.com/file/d/17OBkmDUiA53TAxD2JazSo-F326m1fg7H/view?usp=drive [...]
Format de la ressource électronique :	Pdf
Permalink :	https://e-campus.itech.fr/pmb/opac_css/index.php?lvl=notice_display&id=10971

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